Laser ablation time-of-flight mass spectrometric probing of the surface states of SiO2-based porous materials

被引：0
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作者：
Xu, C. [1 ]
Long, Y. [1 ]
Zhang, R. [1 ]
Zhao, L. [1 ]
Qian, S. [1 ]
Li, Y. [1 ]
机构：
[1] Fudan Univ, Shanghai, China
来源：
Applied Physics A: Materials Science and Processing | 1998年 / 66卷 / 01期
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页码：99 / 102
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