Scanning nonlinear dielectric microscopy with contact sensing mechanism for observation of nanometer sized ferroelectric domains

被引：0
|
作者：
Cho, Yasuo [1 ]
Kazuta, Satoshi [1 ]
Matsuura, Kaori [1 ]
机构：
[1] Res. Inst. of Elec. Communication, Tohoku University, 2-1-1 Katahira, Aoba-ku, Sendai 980-8577, Japan
来源：
Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers | 1999年 / 38卷 / 9 B期
关键词：
Experimental; (EXP);
D O I：
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中图分类号：
学科分类号：
摘要：
A new scanning nonlinear dielectric microscope with very high resolution for the observation of ferroelectric polarization was developed. This microscope has a newly developed contact sensing mechanism for detecting the exact contact point of a probe needle with respect to the surface of a specimen. This contact sensing mechanism enables us to use a probe needle with a very thin pointed end. Using the new microscope, domains in BaTiO3 single crystal and in PbTiO3 thin film were observed. By measuring the c-c domain wall of BaTiO3, the microscope was confirmed to have nanometer-order resolution.
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页码：5689 / 5694
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