Simultaneous observation of nano-sized ferroelectric domains and surface morphology using scanning nonlinear dielectric microscopy

被引：62

作者：

Odagawa, H ^{[1
]}

Cho, Y ^{[1
]}

机构：

[1] Tohoku Univ, Elect Commun Res Inst, Aoba Ku, Sendai, Miyagi 9808577, Japan

来源：

SURFACE SCIENCE | 2000年 / 463卷 / 01期

关键词：

atomic force microscopy; dielectric phenomena; insulating films; models of non-linear phenomena; single crystal surfaces; surface structure; morphology; roughness; and topography;

D O I：

10.1016/S0039-6028(00)00636-1

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

A new type of scanning nonlinear dielectric microscope (SNDM), with an additional function of simultaneous observation of surface morphology, has been developed. This was achieved by using an electrically conducting atomic force microscopy cantilever as a probe needle. Using this new SNDM, simultaneous measurements of several ferroelectric materials, such as LiNbO3 single crystal and lead zirconate titanate (PZT) thin films on SrTiO3 substrates, were performed. Topographic and domain images, which were simultaneously taken from the same location on the materials, were successfully obtained. The result shows that nano-sized ferroelectric 180 degrees c-e domains of PZT thin film having a good correlation with a topographic image were observed. (C) 2000 Elsevier Science B.V. All rights reserved.

引用

页码：L621 / L625

页数：5

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