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Grain boundary structure and electrical properties in Nb-doped SrTiO3 bicrystals
被引:0
|作者:
Yamamoto, Takahisa
[1
]
Hayashi, Katsuro
[1
]
Ikuhara, Yuichi
[1
]
Sakuma, Taketo
[1
]
机构:
[1] Univ of Tokyo, Tokyo, Japan
关键词:
Annealing - Cooling - Current voltage characteristics - Dislocations (crystals) - Doping (additives) - Electric properties - Grain boundaries - Niobium - Point defects - Single crystals - Transmission electron microscopy;
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摘要:
Grain boundary structure and electrical properties were examined for Nb-doped SrTiO3 bicrystals. Bicrystals with Σ1, cobalt-segregated Σ1, and small angle boundaries were prepared by hot joining technique. High-resolution transmission electron microscopy (HRTEM) study revealed that two single crystals were perfectly joined without any secondary phases in all kinds of bicrystals. Σ1 boundary exhibited linear I-V characteristic while non-linear I-V behavior appeared in cobalt-segregated Σ1 boundary in spite of the similar coherent boundary. On the other hand, it was found that non-linearity became remarkable by reduction of cooling-rate after joining even in a small angle boundary, whose dislocation structure is stable against annealing treatment. This result suggests that negative-charged point defects must play an important role on the formation of potential barriers.
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页码:225 / 228
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