Critical thickness of equilibrium epitaxial thin films using finite element method

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作者：
Subramaniam, Anandh [1 ]
机构：
[1] C-714, Riverdale Apartments, Kottur Gardens, Chennai 600 085, India
来源：
Journal of Applied Physics | 2004年 / 95卷 / 12期
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摘要：
(Edited Abstract)
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页码：8472 / 8474
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