Critical thickness of equilibrium epitaxial thin films using finite element method

被引：0
|
作者：
Subramaniam, Anandh [1 ]
机构：
[1] C-714, Riverdale Apartments, Kottur Gardens, Chennai 600 085, India
来源：
Journal of Applied Physics | 2004年 / 95卷 / 12期
关键词：
D O I：
暂无
中图分类号：
学科分类号：
摘要：
(Edited Abstract)
引用
收藏
页码：8472 / 8474
相关论文
共 50 条
  • [31] Determination of critical slip surface using finite element method
    Ahn, TB
    PROCEEDINGS OF THE NINTH (1999) INTERNATIONAL OFFSHORE AND POLAR ENGINEERING CONFERENCE, VOL 1, 1999, 1999, : 472 - 479
  • [32] Finite element modeling of coating thickness using heat transfer method
    Li, Yafeng
    Dhulipalla, Anvesh
    Zhang, Jian
    Park, Hye-Yeong
    Jung, Yeon-Gil
    Koo, Dan Daehyun
    Zhang, Jing
    CIRP Journal of Manufacturing Science and Technology, 2021, 32 : 249 - 256
  • [33] Critical thickness of microscopic thin liquid films
    Manev, ED
    Nguyen, AV
    ADVANCES IN COLLOID AND INTERFACE SCIENCE, 2005, 114 : 133 - 146
  • [34] CRITICAL THICKNESS OF THIN FILMS OF BISMUTH AND TIN
    KOMNIK, YF
    PHYSICS OF METALS AND METALLOGRAPHY-USSR, 1968, 25 (05): : 56 - +
  • [35] Predicting plastic and fracture properties of silicon oxycarbide thin films using extended finite element method
    Deng, Jixi
    Liao, Ningbo
    Zhou, Hongming
    Xue, Wei
    JOURNAL OF ALLOYS AND COMPOUNDS, 2019, 792 : 481 - 486
  • [36] Critical thickness for the agglomeration of thin metal films
    Boragno, C.
    de Mongeot, F. Buatier
    Felici, R.
    Robinson, I. K.
    PHYSICAL REVIEW B, 2009, 79 (15):
  • [37] Analysis of thin film growth using finite element method
    Subramaniam, A
    Ramakrishnan, N
    SURFACE & COATINGS TECHNOLOGY, 2003, 167 (2-3): : 249 - 254
  • [38] Thermal Analysis of Thin Plates Using the Finite Element Method
    Er, G. K.
    Iu, V. P.
    Liu, X. L.
    ISCM II AND EPMESC XII, PTS 1 AND 2, 2010, 1233 : 266 - 271
  • [39] CRITICAL THICKNESS OF EPITAXIAL GROWN SEMICONDUCTOR FILMS WITH STRAINED STRUCTURE
    Li, J. C.
    Li, M.
    Jiang, Q.
    SURFACE REVIEW AND LETTERS, 2008, 15 (06) : 829 - 832
  • [40] Critical misfit of epitaxial growth metallic thin films
    李建忱
    刘伟
    蒋青
    Transactions of Nonferrous Metals Society of China, 2005, (02) : 419 - 422
12345