LIF INVESTIGATIONS OF THE SURFACE CHEMISTRY IN THE DRY PROCESSING OF SEMICONDUCTOR DEVICES.

被引：0

作者：

Singh, O.N. ^{[1
]}

Hopman, H.J. ^{[1
]}

机构：

[1] FOM, Neth, FOM, Neth

来源：

Microelectronics Journal | 1987年 / 18卷 / 02期

关键词：

D O I：

暂无

中图分类号：

学科分类号：

摘要：

引用

页码：39 / 47

共 50 条

[41] METHOD OF ANALYZING RADIO SYSTEMS CONTAINING SEMICONDUCTOR DEVICES.
Asovich, P.L.
1600, (32-33):
[42] TEST PROBES FOR SURFACE MOUNT DEVICES.
Keller, Muriel
Cook, Steve
Test & measurement world, 1985, 5 (12) : 88 - 100
[43] USE OF MIRROR SYSTEMS IN DATA PROCESSING DEVICES.
Nikolov, I.D.
Optoelectronics, Instrumentation and Data Processing (English translation of Avtometriya), 1984, (06): : 59 - 67
[44] TRANSFORM DOMAIN PROCESSING FOR DIGITAL COMMUNICATION SYSTEMS USING SURFACE ACOUSTIC WAVE DEVICES.
Milstein, L.B.
Arsenault, D.R.
Das, P.
AGARD Conference Proceedings, 1978, (239): : 1 - 28
[45] USE OF BF2 + IMPLANTATION IN THE PRODUCTION OF SEMICONDUCTOR DEVICES.
Chernyaev, A.V.
Chernetskii, T.P.
Soviet Microelectronics (English Translation of Mikroelektronika), 1979, 8 (06): : 377 - 380
[46] High-power semiconductor devices. Review and comparative assessment
Linder S.
Russian Electrical Engineering, 2007, 78 (10) : 509 - 514
[47] Fundamentals of a New (Non-Schockley) Theory of Semiconductor Devices.
Goral, Arkadiusz
Elektronika, 1974, 15 (10): : 431 - 434
[48] BIBLIOGRAPHY ON ELECTRON BEAM INDUCED CURRENT ANALYSIS OF SEMICONDUCTOR DEVICES.
Leedy, K.O.
Solid State Technology, 1977, 19 (02) : 45 - 48
[49] Basic Static Properties of the Negative Differential Mobility in Semiconductor Devices.
Goral, Arkadiusz
Elektronika, 1973, 14 (03): : 81 - 84
[50] Surface analysis of lubricious coatings for medical devices.
Calistri-Yeh, M
Baier, R
Chamberlain, A
Copenhagen, D
Meyer, A
Moore, M
Rosebrough, S
Sampath, A
Whitbourne, R
Zhang, XP
ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 2003, 225 : U713 - U713

← 1 2 3 4 5 →