共 50 条
- [21] Thermal deformations and stresses of flip-chip BGA packages with low- and high-Tg underfills IEEE TRANSACTIONS ON ELECTRONICS PACKAGING MANUFACTURING, 2005, 28 (04): : 328 - 337
- [22] Coupled thermal-mechanical simulation methodology to estimate BGA reliability of 2.5D Packages 2020 IEEE 70TH ELECTRONIC COMPONENTS AND TECHNOLOGY CONFERENCE (ECTC 2020), 2020, : 1653 - 1658
- [23] Robot vision methodology for assembly manufacturing tasks CERMA 2007: ELECTRONICS, ROBOTICS AND AUTOMOTIVE MECHANICS CONFERENCE, PROCEEDINGS, 2007, : 289 - +
- [25] Advanced warpage prediction methodology for matrix stacked die BGA during assembly processes 54TH ELECTRONIC COMPONENTS & TECHNOLOGY CONFERENCE, VOLS 1 AND 2, PROCEEDINGS, 2004, : 593 - 600
- [26] Assembly Induced Failures in Thin Film MEMS Packages EUROSIME 2009: THERMAL, MECHANICAL AND MULTI-PHYSICS SIMULATION AND EXPERIMENTS IN MICRO-ELECTRONICS AND MICRO-SYSTEMS, 2009, : 227 - +
- [27] Effects of ball pad configuration on joint reliability in BGA chip-scale packages 6TH ELECTRONICS PACKAGING TECHNOLOGY CONFERENCE, PROCEEDINGS (EPTC 2004), 2004, : 735 - 739
- [29] CHARACTERIZATION OF DIE STRESSES IN CBGA PACKAGES DUE TO COMPONENT ASSEMBLY AND HEAT SINK CLAMPING PROCEEDINGS OF THE ASME PACIFIC RIM TECHNICAL CONFERENCE AND EXHIBITION ON PACKAGING AND INTEGRATION OF ELECTRONIC AND PHOTONIC SYSTEMS, MEMS AND NEMS 2011, VOL 1, 2012, : 493 - 506
- [30] Measurement and Simulation of Moisture Induced Die Stresses in Quad Flat Packages 2016 15TH IEEE INTERSOCIETY CONFERENCE ON THERMAL AND THERMOMECHANICAL PHENOMENA IN ELECTRONIC SYSTEMS (ITHERM), 2016, : 1537 - 1545