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- [3] Fabrication of submicron BSCCO stacked junctions by focused ion beam (FIB) IEEE Transactions on Applied Superconductivity, 1999, 9 (2 III): : 4312 - 4315
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- [7] A simple fabrication process using focused ion beam for deep submicron magnetic tunnel junctions JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS, 2004, 43 (11A): : 7489 - 7490
- [9] MASKLESS FABRICATION OF CONTACT VIAS BY FOCUSED MEV HEAVY-ION BEAM NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1993, 80-1 : 1292 - 1295
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