Fabrication of submicron contact hole with a focused ion beam

被引:0
|
作者
机构
[1] Yasuoka, Yoshizumi
[2] Harakawa, Kenichi
[3] Gamo, Kenji
[4] Namba, Susumu
来源
关键词
4;
D O I
暂无
中图分类号
学科分类号
摘要
引用
收藏
相关论文
共 50 条
  • [21] Fabrication of YBaCuO junctions by the irradiation of focused ion beam
    Shiga, H
    Soutome, Y
    Okabe, Y
    IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY, 1999, 9 (02) : 2890 - 2893
  • [22] Wedge emitter fabrication using focused ion beam
    Ochiai, C
    Sawada, A
    Noriyasu, H
    Takai, M
    Hosono, A
    Okuda, S
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 2001, 19 (03): : 904 - 906
  • [23] Fabrication of nanoscale Ti honeycombs by focused ion beam
    Hosokawa, H
    Shimojima, K
    Chino, Y
    Yamada, Y
    Wen, CE
    Mabuchi, M
    MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING, 2003, 344 (1-2): : 365 - 367
  • [24] Focused ion beam fabrication of silicon print masters
    Li, HW
    Kang, DJ
    Blamire, MG
    Huck, WTS
    NANOTECHNOLOGY, 2003, 14 (02) : 220 - 223
  • [25] Fabrication of YBaCuO junctions by the irradiation of focused ion beam
    Shiga, H.
    Soutome, Y.
    Okabe, Y.
    IEEE Transactions on Applied Superconductivity, 1999, 9 (2 III): : 2890 - 2893
  • [26] Focused ion beam machining for optical microlens fabrication
    Kitamura, M
    Koike, E
    Takasu, N
    Nishimura, T
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS, 2002, 41 (6A): : 4019 - 4021
  • [27] FOCUSED-ION-BEAM PROCESSES FOR DEVICE FABRICATION
    KUBENA, RL
    ANDERSON, CL
    SELIGER, RL
    BRAULT, RG
    MILLER, LJ
    IEEE TRANSACTIONS ON ELECTRON DEVICES, 1981, 28 (10) : 1253 - 1253
  • [28] Focused ion beam nanopatterning for optoelectronic device fabrication
    Kim, YK
    Danner, AJ
    Raftery, JJ
    Choquette, KD
    IEEE JOURNAL OF SELECTED TOPICS IN QUANTUM ELECTRONICS, 2005, 11 (06) : 1292 - 1298
  • [29] Application of focused ion beam for the fabrication of AFM probes
    Kolomiytsev, A. S.
    Lisitsyn, S. A.
    Smirnov, V. A.
    Fedotov, A. A.
    Varzarev, Yu N.
    SCANNING PROBE MICROSCOPY 2017 (SPM-2017), 2017, 256
  • [30] Focused Ion Beam fabrication of large and complex nanopatterns
    Wilhelmi, O.
    Roussel, L.
    Anzalone, P.
    Stokes, D. J.
    Faber, P.
    Reyntjens, S.
    NANOTECH CONFERENCE & EXPO 2009, VOL 1, TECHNICAL PROCEEDINGS: NANOTECHNOLOGY 2009: FABRICATION, PARTICLES, CHARACTERIZATION, MEMS, ELECTRONICS AND PHOTONICS, 2009, : 24 - 27