Ion beam chopping method for low energy time-of-flight measurements

被引：0

作者：

Aratari, R. ^{[1
]}

机构：

[1] EURATOM Assoc, Germany

来源：

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms | 1988年 / B34卷 / 04期

关键词：

Electronic Circuits - Ions - Magnetic Field Effects - Spectrum Analysis;

D O I：

暂无

中图分类号：

学科分类号：

摘要：

Chopping an ion beam by electrically sweeping it over an aperture produces a degradation of the beam quality. After a short review of the problem, a simple alternative method is presented and experimental results are shown.

引用

页码：493 / 498

共 50 条

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