HIGH RELIABILITY DYNAMIC SWITCHING OF DATA TRANSFER PATH AND CIRCUITS.

被引：0

|

作者：

Blum, A.R.

Irro, F.

Sonntag, G.U.

机构：

来源：

IBM Technical Disclosure Bulletin | 1973年 / 16卷 / 06期

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D O I：

暂无

中图分类号：

TP [自动化技术、计算机技术];

学科分类号：

0812 ;

摘要：

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页码：1855 / 1856

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