Interface roughness and asymmetric current-voltage characteristics in resonant tunnelling

被引：0
|
作者：
机构：
[1] Rudberg, Bjorn G.R.
来源：
Rudberg, Bjorn G.R. | 1600年 / 05期
关键词：
Semiconductor Devices;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
引用
收藏
相关论文
共 50 条
  • [31] Molecular current-voltage characteristics
    Seminario, JM
    Zacarias, AG
    Tour, JM
    JOURNAL OF PHYSICAL CHEMISTRY A, 1999, 103 (39): : 7883 - 7887
  • [32] NONLINEARITY OF CURRENT-VOLTAGE CHARACTERISTICS AT A LIQUID SEMICONDUCTOR-METAL INTERFACE
    ZOLYAN, TS
    SOVIET PHYSICS SEMICONDUCTORS-USSR, 1973, 6 (10): : 1750 - 1751
  • [33] Effect of Spacer Layers on Current-Voltage Characteristics of Resonant-Tunneling Diode
    Remnev, M. A.
    Kateev, I. Yu.
    Elesin, V. F.
    SEMICONDUCTORS, 2010, 44 (08) : 1034 - 1039
  • [34] RESONANT TUNNELING PEAKS APPEARED IN THE CURRENT-VOLTAGE CHARACTERISTICS FOR POLYMERIC THIN FILMS
    Tanaka, Toshiaki
    Sato, Aiko
    Asano, Hitoshi
    Takenaga, Mitsuru
    IPACK 2009: PROCEEDINGS OF THE ASME INTERPACK CONFERENCE 2009, VOL 1, 2010, : 517 - 520
  • [35] EFFECT OF CATHODE SPACER LAYER ON THE CURRENT-VOLTAGE CHARACTERISTICS OF RESONANT TUNNELING DIODES
    MOUNAIX, P
    VANBESIEN, O
    LIPPENS, D
    APPLIED PHYSICS LETTERS, 1990, 57 (15) : 1517 - 1519
  • [36] INFLUENCE OF SPACER LAYERS ON THE CURRENT-VOLTAGE CHARACTERISTICS OF RESONANT TUNNEL-DIODES
    IGNATEV, AS
    KAMINSKII, VE
    KOPYLOV, VB
    MOKEROV, VG
    NEMTSEV, GZ
    SHMELEV, SS
    SHUBIN, VS
    SOVIET PHYSICS SEMICONDUCTORS-USSR, 1992, 26 (10): : 1005 - 1008
  • [37] Effect of spacer layers on current-voltage characteristics of resonant-tunneling diode
    M. A. Remnev
    I. Yu. Kateev
    V. F. Elesin
    Semiconductors, 2010, 44 : 1034 - 1039
  • [38] EFFECT OF RESONANT TUNNELING ON THE CURRENT-VOLTAGE CHARACTERISTICS OF SIN TUNNEL-JUNCTIONS
    DEVYATOV, IA
    KUPRIYANOV, MY
    JETP LETTERS, 1990, 52 (05) : 311 - 316
  • [39] Effect of interface roughness on resonant tunnelling in double-barrier heterostructures
    Figielski, T
    Wosinski, T
    Makosa, A
    ACTA PHYSICA POLONICA A, 1996, 90 (04) : 777 - 780
  • [40] Numerical approximations to the treatment of interface roughness scattering in resonant tunnelling diodes
    Klimeck, G
    Lake, R
    Blanks, DK
    SEMICONDUCTOR SCIENCE AND TECHNOLOGY, 1998, 13 (8A) : A165 - A168
12345