X-ray diffraction study of texture evolution in electrodeposited zinc layers

被引：0
|
作者：
Tomov, I. [1 ]
机构：
[1] Bulgarian Acad of Sciences, Sofia, Bulgaria
来源：
Materials Science Forum | 1994年 / 157-6卷 / pt 2期
关键词：
Growth selection - Oriented growth - Oriented nucleation - Pole density - Texture evolution - Texture sharpness - Thin surface sublayer - Vapor deposited layer - X ray diffraction method - Zinc layers;
D O I：
10.4028/www.scientific.net/msf.157-162.1495
中图分类号：
学科分类号：
摘要：
引用
收藏
页码：1495 / 1500
相关论文
共 50 条
  • [21] X-RAY DOUBLE DIFFRACTION BY THIN MONOCRYSTALLINE LAYERS
    SCHILLER, C
    ACTA ELECTRONICA, 1982, 24 (03): : 267 - 271
  • [22] In-situ X-ray diffraction analysis of electrodeposition of zinc layers by using synchrotron radiation
    Imafuku, M
    Kurosaki, M
    Kawasaki, K
    TETSU TO HAGANE-JOURNAL OF THE IRON AND STEEL INSTITUTE OF JAPAN, 1999, 85 (02): : 180 - 183
  • [23] Texture evolution and stress in silver thin films on different substrates using x-ray diffraction
    Zoo, Yeongseok
    Alford, Terry L.
    MATERIALS, PROCESSES, INTEGRATION AND RELIABILITY IN ADVANCED INTERCONNECTS FOR MICRO- AND NANOELECTRONICS, 2007, 990 : 147 - 152
  • [24] X-ray diffraction of electrodeposited nanocrystalline nickel under high pressure
    Grant, C. D.
    Crowhurst, J. C.
    Arsenlis, T.
    Bringa, E. M.
    Wang, Y. M.
    Hawreliak, J. A.
    Pauzauskie, P. J.
    Clark, S. M.
    JOURNAL OF APPLIED PHYSICS, 2009, 105 (08)
  • [25] X-Ray Diffraction and Photoreflectance Study of CuGaSe2 Epitaxial Layers
    Tanaka, Masahiro
    Kodama, Tomohiro
    Nabetani, Yoichi
    Kato, Takamasa
    Matsumoto, Takashi
    JAPANESE JOURNAL OF APPLIED PHYSICS, 2000, 39 (01) : 203 - 204
  • [26] Electrocrystallization of Pt layers onto Au substrates; an X-ray diffraction study
    Molina, IY
    Plyasova, LM
    Cherepanova, SV
    Savinova, ER
    Tsirlina, GA
    ZEITSCHRIFT FUR KRISTALLOGRAPHIE, 2006, : 293 - 298
  • [27] X-ray diffraction study of chalcopyrite ZnSnP2 epitaxial layers
    Francoeur, S
    Seryogin, GA
    Nikishin, SA
    Temkin, H
    SELF-ORGANIZED PROCESSES IN SEMICONDUCTOR ALLOYS, 2000, 583 : 277 - 282
  • [28] X-ray diffraction of electrodeposited nanocrystalline nickel under high pressure
    Grant, C.D.
    Crowhurst, J.C.
    Arsenlis, T.
    Bringa, E.M.
    Wang, Y.M.
    Hawreliak, J.A.
    Pauzauskie, P.J.
    Clark, S.M.
    Journal of Applied Physics, 2009, 105 (08):
  • [29] Microstructural characterization of electrodeposited nanocrystalline nickel films by X-ray diffraction
    Dept. Mech. Eng., Meijo Univ., Tempaku-ku, Nagoya
    468-8502, Japan
    不详
    468-8502, Japan
    不详
    457-8530, Japan
    不详
    679-5148, Japan
    Zairyo, 7 (528-535):
  • [30] Refinement of X-ray diffraction data for zinc bromide
    Kuznetsova, IY
    Kovaleva, IS
    Fedorov, VA
    ZHURNAL NEORGANICHESKOI KHIMII, 1996, 41 (11): : 1833 - 1834
12345