X-RAY DOUBLE DIFFRACTION BY THIN MONOCRYSTALLINE LAYERS

被引：0
|
作者：
SCHILLER, C
机构：
来源：
ACTA ELECTRONICA | 1982年 / 24卷 / 03期
关键词：
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：267 / 271
页数：5
相关论文
共 50 条
  • [1] Diffraction losses in monocrystalline X-ray refractive lenses
    Polikarpov, M.
    Emerich, H.
    Klimova, N.
    Snigireva, I.
    Snigirev, B. A.
    [J]. EUV AND X-RAY OPTICS: SYNERGY BETWEEN LABORATORY AND SPACE V, 2017, 10235
  • [2] ASSESSMENT OF THIN HETEROEPITAXIAL LAYERS USING SKEW ANGLE ASYMMETRICAL X-RAY DOUBLE CRYSTAL DIFFRACTION
    MILES, SJ
    GREEN, GS
    TANNER, BK
    HALLIWELL, MAG
    LYONS, MH
    [J]. CHARACTERIZATION OF THE STRUCTURE AND CHEMISTRY OF DEFECTS IN MATERIALS, 1989, 138 : 539 - 544
  • [3] Interpretation of double x-ray diffraction peaks from InGaN layers
    Pereira, S
    Correia, MR
    Pereira, E
    O'Donnell, KP
    Alves, E
    Sequeira, AD
    Franco, N
    [J]. APPLIED PHYSICS LETTERS, 2001, 79 (10) : 1432 - 1434
  • [4] X-ray diffraction and reflectivity studies of thin porous silicon layers
    Buttard, D
    Dolino, G
    Bellet, D
    Baumbach, T
    [J]. ADVANCES IN MICROCRYSTALLINE AND NANOCRYSTALLINE SEMICONDUCTORS - 1996, 1997, 452 : 437 - 442
  • [5] Thin layers and multilayers of porous silicon: X-ray diffraction investigation
    Buttard, D
    Bellet, D
    Dolino, G
    Baumbach, T
    [J]. JOURNAL OF APPLIED PHYSICS, 1998, 83 (11) : 5814 - 5822
  • [6] Three-beam X-ray diffraction in crystals with thin strain layers
    Borcha, MD
    Kshevetsky, OS
    Tkach, VM
    [J]. SIXTH INTERNATIONAL CONFERENCE ON CORRELATION OPTICS, 2003, 5477 : 206 - 214
  • [7] X-RAY AND NEUTRON DIFFRACTION BY GRAPHITE LAYERS
    BACON, GE
    [J]. NATURE, 1950, 166 (4227) : 794 - 794
  • [8] MEASURING BY DOUBLE DIFFRACTION OF X-RAY DIFFRACTION INDICES
    OTTO, J
    [J]. ZEITSCHRIFT FUR KRISTALLOGRAPHIE KRISTALLGEOMETRIE KRISTALLPHYSIK KRISTALLCHEMIE, 1969, 128 (3-6): : 448 - &
  • [9] X-RAY DETERMINATION OF THE DIFFUSION COEFFICIENTS BY THE METHOD OF DOUBLE THIN METALLIC LAYERS
    LEVITSKAYA, MA
    VODOPYANOVA, NA
    [J]. SOVIET PHYSICS-SOLID STATE, 1962, 4 (02): : 334 - 336
  • [10] Study by X-ray photoelectron spectroscopy and X-ray diffraction of the growth of TiN thin films obtained by nitridation of Ti layers
    Santucci, S
    Lozzi, L
    Passacantando, M
    Picozzi, P
    Alfonsetti, R
    Diamanti, R
    Moccia, G
    [J]. THIN SOLID FILMS, 1996, 290 : 376 - 380
12345