Effects of x-ray irradiation on polycrystalline silicon, thin-film transistors

被引：0
|
作者：
Li, Yixin [1 ]
Antonuk, Larry E. [1 ]
El-Mohri, Youcef [1 ]
Zhao, Qihua [1 ]
Du, Hong [1 ]
Sawant, Amit [1 ]
Wang, Yi [1 ]
机构：
[1] Department of Radiation Oncology, University of Michigan, 519 West William Street, Ann Arbor, MI 48103-4943
来源：
Journal of Applied Physics | 2006年 / 99卷 / 06期
关键词：
X ray analysis;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
Journal article (JA)
引用
收藏
相关论文
共 50 条
  • [41] DEFOCUSING EFFECTS IN THIN-FILM X-RAY CHARACTERIZATION
    LAGOMARSINO, S
    TUCCIARONE, A
    ACTA CRYSTALLOGRAPHICA SECTION A, 1978, 34 : S207 - S208
  • [42] Noise Characterization of Polycrystalline Silicon Thin Film Transistors for X-ray Imagers Based on Active Pixel Architectures
    Antonuk, L. E.
    Koniczek, M.
    McDonald, J.
    El-Mohri, Y.
    Zhao, Q.
    Behravan, M.
    AMORPHOUS AND POLYCRYSTALLINE THIN-FILM SILICON SCIENCE AND TECHNOLOGY-2008, 2008, 1066 : 457 - 462
  • [43] DIRECT OBSERVATION OF GRAIN-BOUNDARY EFFECTS IN POLYCRYSTALLINE SILICON THIN-FILM TRANSISTORS
    LEAMY, HJ
    FRYE, RC
    NG, KK
    CELLER, GK
    POVILONIS, EI
    SZE, SM
    APPLIED PHYSICS LETTERS, 1982, 40 (07) : 598 - 600
  • [44] Integrated amorphous and polycrystalline silicon thin-film transistors in a single silicon layer
    Pangal, K
    Sturm, JC
    Wagner, S
    IEEE TRANSACTIONS ON ELECTRON DEVICES, 2001, 48 (04) : 707 - 714
  • [45] Dependence of the leakage current on the film quality in polycrystalline silicon thin-film transistors
    Dimitriadis, CA
    Farmakis, FV
    Brini, J
    Kamarinos, G
    JOURNAL OF APPLIED PHYSICS, 2000, 88 (05) : 2648 - 2651
  • [46] Polycrystalline Silicon Thin Film Transistors
    Sameshima, Toshiyuki
    THIN FILM TRANSISTORS 10 (TFT 10), 2010, 33 (05): : 183 - 191
  • [47] THIN-FILM X-RAY SPECTROMETRY
    GEISS, RH
    KYSER, DF
    ULTRAMICROSCOPY, 1978, 3 (04) : 397 - 400
  • [48] Polycrystalline silicon thin film transistors
    Bhat, KN
    Rao, PRS
    Panariya, AK
    PHYSICS OF SEMICONDUCTOR DEVICES, VOLS 1 AND 2, 1998, 3316 : 539 - 546
  • [49] A MODEL OF CURRENT VOLTAGE CHARACTERISTICS IN POLYCRYSTALLINE SILICON THIN-FILM TRANSISTORS
    SERIKAWA, T
    SHIRAI, S
    OKAMOTO, A
    SUYAMA, S
    IEEE TRANSACTIONS ON ELECTRON DEVICES, 1987, 34 (02) : 321 - 324
  • [50] Low frequency noise modeling of polycrystalline silicon thin-film transistors
    Deng, W.
    Liang, P.
    Wei, C.
    EUROPEAN PHYSICAL JOURNAL-APPLIED PHYSICS, 2009, 48 (01): : 10303p1 - 10303p6
12345