Effects of x-ray irradiation on polycrystalline silicon, thin-film transistors

被引：0

作者：

Li, Yixin ^{[1
]}

Antonuk, Larry E. ^{[1
]}

El-Mohri, Youcef ^{[1
]}

Zhao, Qihua ^{[1
]}

Du, Hong ^{[1
]}

Sawant, Amit ^{[1
]}

Wang, Yi ^{[1
]}

机构：

[1] Department of Radiation Oncology, University of Michigan, 519 West William Street, Ann Arbor, MI 48103-4943

来源：

Journal of Applied Physics | 2006年 / 99卷 / 06期

关键词：

X ray analysis;

D O I：

暂无

中图分类号：

学科分类号：

摘要：

Journal article (JA)

引用

共 50 条

[21] Effects of X-ray radiation on hydrogenated amorphous silicon thin-film transistors and characteristics of tungsten shield layer
Pang, Hee-suk
Jeong, Yun-sik
Choi, Hong-seok
Han, Chang-Wook
Tak, Yoon-Heung
Ahn, Byung-Chul
CURRENT APPLIED PHYSICS, 2010, 10 (01) : 184 - 186
[22] Effect of X-ray irradiation on a-IGZO and LTPS thin-film transistors for radiography applications
Park, Solah
Song, Min-Kyu
Sung, Taehoon
Kwon, Jang-Yeon
APPLIED SURFACE SCIENCE, 2021, 550
[23] RADIATION EFFECTS ON N-CHANNEL POLYCRYSTALLINE SILICON THIN-FILM TRANSISTORS
YANG, CK
LEE, CL
LEI, TF
CHERN, HN
APPLIED PHYSICS LETTERS, 1995, 67 (23) : 3477 - 3479
[24] Polycrystalline silicon thin-film transistors: A continuous evolving technology
Fortunato, G
THIN SOLID FILMS, 1997, 296 (1-2) : 82 - 90
[25] Dopant and defect interactions in polycrystalline silicon thin-film transistors
Valletta, A., 1600, American Institute of Physics Inc. (97):
[26] ANALYSIS OF LASER ANNEALED POLYCRYSTALLINE SILICON THIN-FILM TRANSISTORS
CHEN, I
APPLIED PHYSICS LETTERS, 1983, 43 (08) : 783 - 785
[27] ELECTRON TRAPPING INSTABILITIES IN POLYCRYSTALLINE SILICON THIN-FILM TRANSISTORS
YOUNG, ND
GILL, A
SEMICONDUCTOR SCIENCE AND TECHNOLOGY, 1990, 5 (01) : 72 - 77
[28] 1/fγ noise in polycrystalline silicon thin-film transistors
Dimitriadis, CA
Brini, J
Lee, JI
Farmakis, FV
Kamarinos, G
JOURNAL OF APPLIED PHYSICS, 1999, 85 (07) : 3934 - 3936
[29] ION-IMPLANTATION IN POLYCRYSTALLINE SILICON THIN-FILM TRANSISTORS
SHEN, DS
KWOR, RY
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1993, 74 (1-2): : 113 - 117
[30] Modeling of kink effect in polycrystalline silicon thin-film transistors
Deng, Wanling
Zheng, Xueren
SOLID-STATE ELECTRONICS, 2009, 53 (06) : 669 - 673

← 1 2 3 4 5 →