Effects of x-ray irradiation on polycrystalline silicon, thin-film transistors

被引：0
|
作者：
Li, Yixin [1 ]
Antonuk, Larry E. [1 ]
El-Mohri, Youcef [1 ]
Zhao, Qihua [1 ]
Du, Hong [1 ]
Sawant, Amit [1 ]
Wang, Yi [1 ]
机构：
[1] Department of Radiation Oncology, University of Michigan, 519 West William Street, Ann Arbor, MI 48103-4943
来源：
Journal of Applied Physics | 2006年 / 99卷 / 06期
关键词：
X ray analysis;
D O I：
暂无
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学科分类号：
摘要：
Journal article (JA)
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