Scanning Hartmann test method and its application lens aberration measurement

被引:0
|
作者
Liu, Dan [1 ,2 ]
Huang, Huijie [1 ]
Ren, Bingqiang [1 ]
Zeng, Aijun [1 ]
Yan, Yan [1 ]
Wang, Xiangzhao [1 ]
机构
[1] Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Shanghai 201800, China
[2] Graduate School, Chinese Academy of Sciences, Beijing 100039, China
关键词
Aberrations - Lenses - Light measurement - Scanning;
D O I
暂无
中图分类号
学科分类号
摘要
A scanning Hartmann test method is proposed and its measurement principle is described. The scanning Hartmann test setup is formed by modifying the Hartmann screen of the conventional Hartmann test setup. With the rotation of the scanning Hartmann screen and the improved hole arrangement, the whole information of the lens to be tested in the full aperture can be obtained. The measurement accuracy of the aberration is improved and the local error of the lens can be got. In the method, no change of the Hartmann screen is needed for measuring the lenses of different aperture sizes. Experimental results of aberration measurements of two lenses are given to verify the usefulness of the setup.
引用
收藏
页码:725 / 728
相关论文
共 50 条
  • [41] A METHOD OF MEASURING AXIAL CHROMATIC ABERRATION IN AN OBJECTIVE LENS
    Herriott, W.
    JOURNAL OF THE SOCIETY OF MOTION PICTURE ENGINEERS, 1933, 20 (04): : 323 - 331
  • [42] Projection lens wave-front aberration measurement method based on adaptive aerial image denoising
    Yang, J. (yangjishuo_01@126.com), 1600, Chinese Optical Society (33):
  • [43] Developed wavelength scanning interferometry and its application for distance measurement
    Wang, Y
    Liao, YB
    Tian, Q
    Zhang, EY
    Zhang, M
    SMART STRUCTURES AND MATERIALS 1998: SENSORY PHENOMENA AND MEASUREMENT INSTRUMENTATION FOR SMART STRUCTURES AND MATERIALS, 1998, 3330 : 209 - 217
  • [44] Measurement of lens parameters based on Shack-Hartmann wavefront sensor
    Deng, Zijin
    Li, Changwei
    Zhang, Sijiong
    OPTICS AND LASERS IN ENGINEERING, 2025, 184
  • [45] General method for replacing a thin lens with a thick lens with the same value of Seidel aberration coefficient of spherical aberration or coma
    Miks, Antonin
    Novak, Pavel
    JOURNAL OF THE OPTICAL SOCIETY OF AMERICA A-OPTICS IMAGE SCIENCE AND VISION, 2021, 38 (09) : 1372 - 1379
  • [46] General method for replacing a thin lens with a thick lens with the same value of Seidel aberration coefficient of spherical aberration or coma
    Mikš, Antonín
    Novák, Pavel
    Novák, Pavel (pavel.novak.3@fsv.cvut.cz), 1600, The Optical Society (38): : 1372 - 1379
  • [47] Axial scanning and spherical aberration correction in confocal microscopy employing an adaptive lens
    Philipp, Katrin
    Lemke, Florian
    Wapler, Matthias C.
    Koukourakis, Nektarios
    Wallrabe, Ulrike
    Czarske, Jurgen W.
    OPTICS, PHOTONICS, AND DIGITAL TECHNOLOGIES FOR IMAGING APPLICATIONS V, 2018, 10679
  • [48] Aerial image model and application to aberration measurement
    Burov, Anatoly Y.
    Li, Liang
    Yang, Zhiyong
    Wang, Fan
    Duan, Lifeng
    OPTICAL MICROLITHOGRAPHY XXIII, 2010, 7640
  • [49] Aero-optical aberration measuring method based on NPLS and its application
    Yi ShiHe
    Tian LiFeng
    Zhao YuXin
    He Lin
    Chen Zhi
    CHINESE SCIENCE BULLETIN, 2010, 55 (31): : 3545 - 3549
  • [50] Aero-optical aberration measuring method based on NPLS and its application
    YI ShiHe
    Science Bulletin, 2010, (31) : 3544 - 3548