Generalized exponential poisson model for software reliability growth

被引：0
|
作者：
Electronics Test and Development Centre , Centre For Reliability , Chennai 600 041, India [1 ]
不详 [2 ]
机构：
来源：
Int. J. Perform. Eng. | 2006年 / 3卷 / 291-301期
关键词：
18;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
引用
收藏
相关论文
共 50 条
  • [21] Software reliability measurement use software reliability growth model in testing
    Jung, HJ
    Yang, HS
    [J]. COMPUTATIONAL SCIENCE AND ITS APPLICATIONS - ICCSA 2005, PT 3, 2005, 3482 : 739 - 747
  • [22] A Novel Software Reliability Growth Model Based on Generalized Imperfect Debugging NHPP Framework
    Luo, Hang
    Xu, Lijia
    He, Liang
    Jiang, Landu
    Long, Ting
    [J]. IEEE ACCESS, 2023, 11 : 71573 - 71593
  • [23] New software reliability growth model
    Wu, Cai-Hua
    Zhu, Xiao-Dong
    Liu, Jun-Tao
    Wang, Yi-Gang
    [J]. Xi Tong Gong Cheng Yu Dian Zi Ji Shu/Systems Engineering and Electronics, 2009, 31 (08): : 2024 - 2028
  • [24] A reliability growth model for modular software
    Okamura, H
    Kuroki, S
    Dohi, T
    Osaki, S
    [J]. ELECTRONICS AND COMMUNICATIONS IN JAPAN PART II-ELECTRONICS, 2004, 87 (05): : 43 - 53
  • [25] Truncated software reliability growth model
    Williams D.R.P.
    Vivekanandan P.
    [J]. Journal of Applied Mathematics and Computing, 2002, 9 (2) : 591 - 599
  • [26] Truncated software reliability growth model
    Prince Williams, D.R.
    Vivekanandan, P.
    [J]. Journal of Applied Mathematics and Computing, 2002, 9 (02) : 591 - 599
  • [27] Truncated software reliability growth model
    Williams, D.R. Prince
    Vivekanandan, P.
    [J]. Korean Journal of Computational and Applied Mathematics, 2002, 9 (02): : 591 - 599
  • [28] Stochastic model of software reliability based on exponential smoothing techniques
    Li, Suoping
    Wu, Huichao
    [J]. PROCEEDINGS OF THE 2007 CONFERENCE ON SYSTEMS SCIENCE, MANAGEMENT SCIENCE AND SYSTEM DYNAMICS: SUSTAINABLE DEVELOPMENT AND COMPLEX SYSTEMS, VOLS 1-10, 2007, : 1189 - 1194
  • [29] Analysis of Software Reliability Data using Exponential Power Model
    Srivastava, Ashwini Kumar
    Kumar, Vijay
    [J]. INTERNATIONAL JOURNAL OF ADVANCED COMPUTER SCIENCE AND APPLICATIONS, 2011, 2 (02) : 38 - 45
  • [30] SOFTWARE-RELIABILITY ASSESSMENT FOR AN EXPONENTIAL-S-SHAPED RELIABILITY GROWTH PHENOMENON
    KIMURA, M
    YAMADA, S
    OSAKI, S
    [J]. COMPUTERS & MATHEMATICS WITH APPLICATIONS, 1992, 24 (1-2) : 71 - 78
12345