Truncated software reliability growth model

被引：0
|
作者：
Prince Williams, D.R. [1 ]
Vivekanandan, P. [2 ]
机构：
[1] Department of Mathematics, MNM Jain Engineering College, Anna University, Chennai 600 096, India
[2] School of Mathematics, Anna University, Chennai 600 025, India
来源：
Journal of Applied Mathematics and Computing | 2002年 / 9卷 / 02期
关键词：
Application programs - Failure rate - Error detection - Parameter estimation;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
Due to the large scale application of software systems, software reliability plays an important role in software developments. In this paper, a software reliability growth model (SRGM) is proposed. The testing time on the right is truncated in this model. The instantaneous failure rate, mean-value function, error detection rate, reliability of the software,estimation of parameters and the simple applications of this model are discussed. © 2002 Korean Society for Computational & Applied Mathematics and Korean SIGCAM.
引用
收藏
页码：591 / 599
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