Research of test node selecting for fault diagnosis based on value measure

被引：0
|
作者：
Wang, Yin-Kun [1 ]
Wang, Xue-Qi [1 ]
Xiao, Ming-Qing [1 ]
机构：
[1] Engineering Inst., Air Force Engineering Univ., Xi'an 710038, China
来源：
Xi Tong Gong Cheng Yu Dian Zi Ji Shu/Systems Engineering and Electronics | 2006年 / 28卷 / 10期
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页码：1606 / 1608
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