Non-Gaussian process fault detection based on wavelet kernel clustering

被引：0
|
作者：
Wang, Kun [1 ]
Du, Wenli [1 ]
Qian, Feng [1 ]
机构：
[1] Key Laboratory of Advanced Control and Optimization for Chemical Processes, East China University of Science and Technology, Shanghai 200237, China
来源：
Huagong Xuebao/CIESC Journal | 2011年 / 62卷 / 02期
关键词：
Compendex;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
Fault detection
引用
收藏
页码：427 / 432
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