Ferroelectric film thickness dependence of properties of infrared detector with an SiO2 aerogel thermal insulation layer

被引：0

作者：

Lin, Tie ^{[1
]}

Sun, Jing-Lan ^{[1
]}

Meng, Xiang-Jian ^{[1
]}

Ma, Jian-Hua ^{[1
]}

Shi, Fu-Wen ^{[1
]}

Zhang, Xiao-Dong ^{[1
]}

Wang, Lin ^{[1
]}

Chen, Jing ^{[1
]}

Chu, Jun-Hao ^{[1
]}

机构：

[1] National Laboratory for Infrared Physics, Shanghai Institute of Technical Physics, Shanghai 200083, China

来源：

Hongwai Yu Haomibo Xuebao/Journal of Infrared and Millimeter Waves | 2007年 / 26卷 / 05期

关键词：

D O I：

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中图分类号：

学科分类号：

摘要：

引用

页码：329 / 331

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