Ferroelectric film thickness dependence of properties of infrared detector with an SiO2 aerogel thermal insulation layer

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作者
Lin, Tie [1 ]
Sun, Jing-Lan [1 ]
Meng, Xiang-Jian [1 ]
Ma, Jian-Hua [1 ]
Shi, Fu-Wen [1 ]
Zhang, Xiao-Dong [1 ]
Wang, Lin [1 ]
Chen, Jing [1 ]
Chu, Jun-Hao [1 ]
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[1] National Laboratory for Infrared Physics, Shanghai Institute of Technical Physics, Shanghai 200083, China
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页码:329 / 331
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