An easy linear-compression test pattern generation method

被引：0
|
作者：
Cao, Lei [1 ]
Lei, Shaochong [1 ]
Wang, Zhen [1 ]
Liang, Feng [1 ]
机构：
[1] School of Electronics and Information Engineering, Xi'an Jiaotong University, Xi'an 710049, China
来源：
Hsi-An Chiao Tung Ta Hsueh/Journal of Xi'an Jiaotong University | 2010年 / 44卷 / 12期
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D O I：
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学科分类号：
摘要：
11
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页码：76 / 81
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