CIRCUITS FOR PSEUDOEXHAUSTIVE TEST PATTERN GENERATION

被引：19
|
作者：
WANG, LT
MCCLUSKEY, EJ
机构：
[1] Stanford Univ, CA, USA
来源：
IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS | 1988年 / 7卷 / 10期
关键词：
Manu5cript received October 13; 1986; revised August 21. 1987. This work was supported in part by the National Science Foundation under Grant MCS-8200129 and in part by the AIDA Corporation under the Honors Co-operative Program (HCP) with Stanford University. The review of this paper was arranged by Associate Editor T. Williams;
D O I：
10.1109/43.7806
中图分类号：
TP3 [计算技术、计算机技术];
学科分类号：
0812 ;
摘要：
40
引用
收藏
页码：1068 / 1080
页数：13
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