Photoluminescence characterization of strained Si-SiGe-on-insulator wafers

被引：0
|
作者：
Wang, Dong [1 ]
Matsumoto, Koji [2 ]
Nakamae, Masahiko [2 ]
Nakashima, Hiroshi [1 ]
机构：
[1] Art, Science and Technology Center for Cooperative Research, Kyushu University, 6-1 Kasuga-koen, Kasuga, Fukuoka 816-8580, Japan
[2] SUMCO Corporation, 2201 Oaza Kamioda, Kohoku-cho, Kshima-gun, Saga 849-0579, Japan
来源：
Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers | 2006年 / 45卷 / 4 B期
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摘要：
Journal article (JA)
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页码：3012 / 3016
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