Improved reliability single loop single feed 7T SRAM cell for biomedical applications

被引：0
|
作者：
Panchal, Ashish [1 ]
Sharma, Priyanka [2 ]
Gupta, Aastha [2 ]
Neema, Vaibhav [2 ]
Tiwari, Nidhi [1 ]
Sindal, Ravi [2 ]
机构：
[1] Department of Electronics and Communication, SAGE University, Indore, India
[2] Department of Electronics and Telecommunication, IET-Devi Ahilya University, Indore, India
来源：
Memories - Materials, Devices, Circuits and Systems | 2023年 / 4卷
关键词：
All Open Access; Gold;
D O I：
10.1016/j.memori.2023.100057
中图分类号：
学科分类号：
摘要：
22
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