A comprehensive review of accelerated degradation testing

被引：0
|
作者：
Deng, Ai-Min [1 ,2 ]
Chen, Xun [1 ]
Zhang, Chun-Hua [1 ]
Wang, Ya-Shun [1 ]
机构：
[1] College of Mechanics and Automation, National University of Defense Technology, Changsha 410073, China
[2] EAAF Equipment Institute of Land-based Air Defense, Beijing 100085, China
来源：
Binggong Xuebao/Acta Armamentarii | 2007年 / 28卷 / 08期
关键词：
Data reduction - Optimization - Reliability;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
Accelerated life testing (ALT) and accelerated degradation testing (ADT) are two main kind of reliability accelerated testing technology. ALT is abroad studied by both statisticians and reliability engineers, but there are just a few researchers who study the theory and engineering practice of ADT. The comparison between ADT and ALT technologies, related background, degradation models, data analysis methods and design and optimization of ADT are described. The recent statuses of ADT technology and engineering application are summarized. The key techniques of ADT are also explored and some suggestions are given for further researches.
引用
收藏
页码：1002 / 1007
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