Test methodology using PXI and high-speed digital I/O

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作者：
Garza, Rick [1 ]
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[1] University of North Texas, G Systems, 1240 E. Campbell Rd, Richardson, TX 75081, United States
来源：
EE: Evaluation Engineering | 2010年 / 49卷 / 07期
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页码：24 / 28
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