Review of multiple-stress models in accelerated life testing

被引：0

作者：

Li, Xiao-Yang ^{[1
]}

Jiang, Tong-Min ^{[1
]}

机构：

[1] Dept. of Project System Engineering, Beijing Univ. of Aeronautics and Astronautics, Beijing 100083, China

来源：

Xi Tong Gong Cheng Yu Dian Zi Ji Shu/Systems Engineering and Electronics | 2007年 / 29卷 / 05期

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D O I：

暂无

中图分类号：

学科分类号：

摘要：

引用

页码：828 / 831

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