Review of multiple-stress models in accelerated life testing

被引：0
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作者：
Li, Xiao-Yang [1 ]
Jiang, Tong-Min [1 ]
机构：
[1] Dept. of Project System Engineering, Beijing Univ. of Aeronautics and Astronautics, Beijing 100083, China
来源：
Xi Tong Gong Cheng Yu Dian Zi Ji Shu/Systems Engineering and Electronics | 2007年 / 29卷 / 05期
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页码：828 / 831
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