March test for 3-coupling faults in random-access memories. A built-in self-testing logic design

被引：0

作者：

Caşcaval, Petru ^{[1
]}

Silion, Radu ^{[1
]}

机构：

[1] Dept. of Computer Science and Engineering, Gh. Asachi Technical University of Iaşi, 53A, D. Mangeron, 700050 Iaşi, Romania

来源：

WSEAS Transactions on Computers | 2007年 / 6卷 / 02期

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摘要：

引用

页码：215 / 222

共 14 条

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[7] March test algorithm for unlinked static reduced three-cell coupling faults in random-access memories
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[J]. MICROELECTRONICS JOURNAL, 2019, 93
[8] A Multibackground March Test for Static Neighborhood Pattern-Sensitive Faults in Random-Access Memories
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[J]. ELEKTRONIKA IR ELEKTROTECHNIKA, 2012, 119 (03) : 81 - 86
[9] March SR3C: A Test for a reduced model of all static simple three-cell coupling faults in random-access memories
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[J]. MICROELECTRONICS JOURNAL, 2010, 41 (04) : 212 - 218
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