Research on measuring technique for surface uniformity of the ultraviolet ICCD detector

被引：0
|
作者：
Zhao, Yu-Huan
Yan, Feng
Zhou, Yue
Sui, Yong-Xin
Yang, Huai-Jiang
Cao, Jian-Lin
机构：
[1] State Key Laboratory of Applied Optics, Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Science, Changchun 130033, China
[2] Graduate School of the Chinese Academy of Sciences, Beijing 100039, China
来源：
Guangxue Jishu/Optical Technique | 2008年 / 34卷 / 06期
关键词：
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页码：886 / 888
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