Ferroelectric properties of PbxSr1-xTiO3 and its compositionally graded thin films grown on the highly oriented LaNiO3 buffered Pt/Ti/SiO2/Si substrates

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作者：
Zhai, Jiwei [1 ]
Yao, Xi [1 ]
Xu, Zhengkui [2 ]
Chen, Haydn [2 ]
机构：
[1] Functional Materials Research Laboratory, Tongji University, Shanghai 200092, China
[2] Department of Physics and Materials Science, City University of Hong Kong, Kowloon, Hong Kong
来源：
Journal of Applied Physics | 2006年 / 100卷 / 03期
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