Ferroelectric properties of PbxSr1-xTiO3 and its compositionally graded thin films grown on the highly oriented LaNiO3 buffered Pt/Ti/SiO2/Si substrates

被引：0

作者：

Zhai, Jiwei ^{[1
]}

Yao, Xi ^{[1
]}

Xu, Zhengkui ^{[2
]}

Chen, Haydn ^{[2
]}

机构：

[1] Functional Materials Research Laboratory, Tongji University, Shanghai 200092, China

[2] Department of Physics and Materials Science, City University of Hong Kong, Kowloon, Hong Kong

来源：

Journal of Applied Physics | 2006年 / 100卷 / 03期

关键词：

30;

D O I：

暂无

中图分类号：

学科分类号：

摘要：

Journal article (JA)

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[1] Ferroelectric properties of PbxSr1-xTiO3 and its compositionally graded thin films grown on the highly oriented LaNiO3 buffered Pt/Ti/SiO2/Si substrates
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[8] Ferroelectric and pyroelectric properties of highly (110)-oriented Pb(Zr0.40Ti0.60)O3 thin films grown on Pt/LaNiO3/SiO2/Si substrates (vol 90, art no 232908, 2007)
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