Multi-source fully test-time adaptation

被引:0
|
作者
Du, Yuntao [1 ]
Luo, Siqi [2 ]
Xin, Yi [2 ]
Chen, Mingcai [2 ]
Feng, Shuai [2 ]
Zhang, Mujie [2 ]
Wang, Chonngjun [2 ]
机构
[1] Beijing Inst Gen Artificial Intelligence BIGAI, Beijing, Peoples R China
[2] Nanjing Univ, State Key Lab Novel Software Technol, Nanjing, Peoples R China
基金
中国国家自然科学基金;
关键词
Test-time adaptation; Domain adaptation; Transfer learning;
D O I
10.1016/j.neunet.2024.106661
中图分类号
TP18 [人工智能理论];
学科分类号
081104 ; 0812 ; 0835 ; 1405 ;
摘要
Deep neural networks have significantly advanced various fields. However, these models often encounter difficulties in achieving effective generalization when the distribution of test samples varies from that of the training samples. Recently, some fully test-time adaptation methods have been proposed to adapt the trained model with the unlabeled test samples before prediction to enhance the test performance. Despite achieving remarkable results, these methods only involve one trained model, which could only provide certain side information for the test samples. In real-world scenarios, there could be multiple available trained models that are beneficial to the test samples and are complementary to each other. Consequently, to better utilize these trained models, in this paper, we propose the problem of multi-source fully test-time adaptation to adapt multiple trained models to the test samples. To address this problem, we introduce a simple yet effective method utilizing a weighted aggregation scheme and introduce two unsupervised losses. The former could adaptively assign a higher weight to a more relevant model, while the latter could jointly adapt models with online unlabeled samples. Extensive experiments on three image classification datasets show that the proposed method achieves better results than baseline methods, demonstrating the superiority in adapting to multiple models.
引用
收藏
页数:10
相关论文
共 50 条
  • [31] Parameter-free Online Test-time Adaptation
    Boudiaf, Malik
    Mueller, Romain
    Ben Ayed, Ismail
    Bertinetto, Luca
    2022 IEEE/CVF CONFERENCE ON COMPUTER VISION AND PATTERN RECOGNITION (CVPR), 2022, : 8334 - 8343
  • [32] Improved Self-Training for Test-Time Adaptation
    Ma, Jing
    2024 IEEE/CVF CONFERENCE ON COMPUTER VISION AND PATTERN RECOGNITION (CVPR), 2024, : 23701 - 23710
  • [33] Prototypical class-wise test-time adaptation
    Lee, Hojoon
    Lee, Seunghwan
    Jung, Inyoung
    Korea, Sungeun Hong
    PATTERN RECOGNITION LETTERS, 2025, 187 : 49 - 55
  • [34] Efficient Test-Time Model Adaptation without Forgetting
    Niu, Shuaicheng
    Wu, Jiaxiang
    Zhang, Yifan
    Chen, Yaofo
    Zheng, Shijian
    Zhao, Peilin
    Tan, Mingkui
    INTERNATIONAL CONFERENCE ON MACHINE LEARNING, VOL 162, 2022,
  • [35] Multi-Source Domain Adaptation Enhanced Warehouse Dwell Time Prediction
    Zhao, Wei
    Mao, Jiali
    Lv, Xingyi
    Jin, Cheqing
    Zhou, Aoying
    IEEE TRANSACTIONS ON KNOWLEDGE AND DATA ENGINEERING, 2024, 36 (06) : 2533 - 2547
  • [36] Unraveling Batch Normalization for Realistic Test-Time Adaptation
    Su, Zixian
    Guo, Jingwei
    Yao, Kai
    Yang, Xi
    Wang, Qiufeng
    Huang, Kaizhu
    THIRTY-EIGHTH AAAI CONFERENCE ON ARTIFICIAL INTELLIGENCE, VOL 38 NO 13, 2024, : 15136 - 15144
  • [37] Test-time Domain Adaptation for Monocular Depth Estimation
    Li, Zhi
    Sh, Shaoshuai
    Schiele, Bernt
    Dai, Dengxin
    2023 IEEE INTERNATIONAL CONFERENCE ON ROBOTICS AND AUTOMATION, ICRA, 2023, : 4873 - 4879
  • [38] Exploring Motion Cues for Video Test-Time Adaptation
    Zeng, Runhao
    Deng, Qi
    Xu, Huixuan
    Niu, Shuaicheng
    Chen, Jian
    PROCEEDINGS OF THE 31ST ACM INTERNATIONAL CONFERENCE ON MULTIMEDIA, MM 2023, 2023, : 1840 - 1850
  • [39] Test-Time Adaptation with Shape Moments for Image Segmentation
    Bateson, Mathilde
    Lombaert, Herve
    Ben Ayed, Ismail
    MEDICAL IMAGE COMPUTING AND COMPUTER ASSISTED INTERVENTION, MICCAI 2022, PT IV, 2022, 13434 : 736 - 745
  • [40] MedBN: Robust Test-Time Adaptation against Malicious Test Samples
    Park, Hyejin
    Hwang, Jeongyeon
    Mun, Sunung
    Park, Sangdon
    Ok, Jungseul
    2024 IEEE/CVF CONFERENCE ON COMPUTER VISION AND PATTERN RECOGNITION, CVPR 2024, 2024, : 5997 - 6007