2.2.1 Test time reduction by optimal test sequencing1

被引：0
|
作者：
Boumen, R. [1 ]
de Jong, I.S.M. [1 ]
van de Mortel-Fronczak, J.M. [1 ]
Rooda, J.E. [1 ]
机构：
[1] Systems Engineering Group, Department of Mechanical Engineering, Eindhoven University of Technology, 5600 MB, Eindhoven, Netherlands
来源：
INCOSE International Symposium | 2006年 / 16卷 / 01期
关键词：
D O I：
10.1002/j.2334-5837.2006.tb02741.x
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学科分类号：
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页码：259 / 269
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