Chemical state imaging of Li using scanning auger electron microscopy

被引:0
|
作者
Ishida, Nobuyuki [1 ]
Fukumitsu, Hitoshi [2 ]
Fujita, Daisuke [1 ]
机构
[1] National Institute for Materials Science, 1-2-1 Sengen, Tsukuba-shi, Ibaraki,305-0047, Japan
[2] Technology Innovation Center, Sumika Chemical Analysis Service (SCAS), Ltd., 3-1-135 Kasugade-naka, Konohana-ku, Osaka-shi, Osaka,554-0022, Japan
关键词
All Open Access; Gold;
D O I
10.3131/jvsj2.58.379
中图分类号
学科分类号
摘要
39
引用
收藏
页码:379 / 386
相关论文
共 50 条
  • [21] SCANNING AUGER-ELECTRON MICROSCOPY AT 30 NM RESOLUTION
    VENABLES, JA
    JANSSEN, AP
    HARLAND, CJ
    JOYCE, BA
    PHILOSOPHICAL MAGAZINE, 1976, 34 (03): : 495 - 500
  • [23] Imaging p-n junctions by scanning Auger microscopy
    Ide, T
    Hiroshima, S
    Shimizu, K
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, 1998, 37 (8B): : L963 - L965
  • [24] Digital imaging for scanning electron microscopy
    Postek, MT
    Vladar, AE
    SCANNING, 1996, 18 (01) : 1 - 7
  • [25] Imaging guidelines for scanning electron microscopy
    Laudate, T
    ADVANCED MATERIALS & PROCESSES, 2003, 161 (07): : 23 - 25
  • [26] CHEMICAL IMAGING BY SCANNING FORCE MICROSCOPY
    AKARI, S
    HORN, D
    KELLER, H
    SCHREPP, W
    ADVANCED MATERIALS, 1995, 7 (06) : 549 - 551
  • [27] Surface sensitivity effects with local probe scanning Auger-scanning electron microscopy
    van Agterveld, DTL
    Palasantzas, G
    De Hosson, JTM
    APPLIED PHYSICS LETTERS, 1999, 75 (08) : 1080 - 1082
  • [28] Surface sensitivity effects with local probe scanning Auger-scanning electron microscopy
    Van Agterveld, DTL
    Palasantzas, G
    De Hosson, JTM
    ADVANCES IN MATERIALS PROBLEM SOLVING WITH THE ELECTRON MICROSCOPE, 2001, 589 : 81 - 86
  • [29] Forescattered electron imaging of nanoparticles in scanning electron microscopy
    Liu, Junliang
    Lozano-Perez, Sergio
    Karamched, Phani
    Holter, Jennifer
    Wilkinson, Angus J.
    Grovenor, Chris R. M.
    MATERIALS CHARACTERIZATION, 2019, 155
  • [30] SOFTWARE FOR SCANNING AUGER MICROSCOPY
    PRUTTON, M
    PEACOCK, DC
    JOURNAL OF MICROSCOPY-OXFORD, 1982, 127 (JUL): : 105 - 118