Sensitivity analysis method on detecting ability of electro-optical system

被引：0
|
作者：
Tan, Bi-Tao [1 ,2 ,3 ]
Chen, Hong-Bin [1 ]
Wang, Qun-Shu [3 ]
Guan, Xiao-Wei [3 ]
机构：
[1] Institute of Optics and Electronics, Chinese Academy of Sciences, Chengdu 610209, China
[2] University of Chinese Academy of Sciences, Beijing 100049, China
[3] Northwest Institute of Nuclear Technology, Xi'an 710024, China
来源：
Guangzi Xuebao/Acta Photonica Sinica | 2013年 / 42卷 / 11期
关键词：
D O I：
10.3788/gzxb20134211.1340
中图分类号：
学科分类号：
摘要：
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页码：1340 / 1344
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