Sensitivity analysis method on detecting ability of electro-optical system

被引:0
|
作者
Tan, Bi-Tao [1 ,2 ,3 ]
Chen, Hong-Bin [1 ]
Wang, Qun-Shu [3 ]
Guan, Xiao-Wei [3 ]
机构
[1] Institute of Optics and Electronics, Chinese Academy of Sciences, Chengdu 610209, China
[2] University of Chinese Academy of Sciences, Beijing 100049, China
[3] Northwest Institute of Nuclear Technology, Xi'an 710024, China
来源
Guangzi Xuebao/Acta Photonica Sinica | 2013年 / 42卷 / 11期
关键词
D O I
10.3788/gzxb20134211.1340
中图分类号
学科分类号
摘要
引用
收藏
页码:1340 / 1344
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