Ensuring a high quality digital device through design for testability

被引：0

作者：

机构：

[1] Ngene, Christopher Umerah

来源：

Ngene, C.A. | 1600年 / University of Zagreb Faculty of Electrical Engineering and Computing卷 / 20期

关键词：

Design for testability;

D O I：

10.2498/cit.1001982

中图分类号：

学科分类号：

摘要：

引用

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