Highly Reliable Lateral Migration-Based TFT-Type Neuron Device for Spiking Neural Networks

被引:0
|
作者
Park, Min-Kyu [1 ]
Hwang, Joon [1 ]
Bae, Jong-Ho [2 ]
Kim, Jae-Joon [1 ]
Lee, Jong-Ho [1 ]
机构
[1] Seoul Natl Univ, Dept Elect & Comp Engn, Seoul 08826, South Korea
[2] Kookmin Univ, Sch Elect Engn, Seoul 02707, South Korea
基金
新加坡国家研究基金会;
关键词
Tunneling; Logic gates; Silicon; Neurons; Electrons; Pulse measurements; Homeostasis; Neuron device; spiking neural networks; flash memory; lateral migration; CHARGE;
D O I
10.1109/LED.2024.3445970
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
A CMOS-compatible Thin Film Transistor (TFT)-type Center Path neuron device with homeostasis characteristics is proposed. By modifying the charge injection path of the gate insulator stack, the proposed neuron device operates with lateral migration, which was conventionally perceived as a disadvantage in the memory industry. Various measured electrical characteristics of the Center Path device show that directly injected charges from the channel poly-Si to the charge trap Si3N4 with low operational voltage laterally migrate to the Si3N4 layer above the tunneling SiO2 layer. Furthermore, the proposed Center Path device successfully demonstrates the integration with homeostasis functionality observed in biological neurons due to its discrete operational schemes.
引用
收藏
页码:1780 / 1783
页数:4
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