Simulation-Based Ultralow Energy and High-Speed LIF Neuron Using Silicon Bipolar Impact Ionization MOSFET for Spiking Neural Networks

被引:27
|
作者
Kumar Kamal, Alok [1 ]
Singh, Jawar [1 ]
机构
[1] Indian Inst Technol Patna, Dept Elect Engn, Patna 801106, Bihta, India
关键词
Impact ionization; Impact ionization (II) MOS; L-shaped gate bipolar impact ionization MOS (L-BIMOS); leaky integrated fire (LIF); CIRCUIT;
D O I
10.1109/TED.2020.2985076
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The silicon bipolar impact ionization MOSFET offers potential for the realization of leaky integrated fire (LIF) silicon neuron due to the presence of parasitic bipolar junction transistor (BJT) in the floating body. In this article, we have proposed an L-shaped gate bipolar impact ionization MOS (L-BIMOS) with reduced breakdown voltage (V-B = 1.68 V) and demonstrated the functioning of LIF neuron based on the positive feedback mechanism of parasitic BJT. Using the 2-D TCAD simulations, we manifest that the proposed L-BIMOS exhibits a low threshold voltage (0.2 V) for firing a spike, and the minimum energy required to fire a single spike for L-BIMOS is calculated to be 0.18 pJ, which makes the proposed device 194 times more energy efficient than the PD-SOI MOSFET silicon neuron and 5 x 103 times more energy efficient than the analog/digital circuit-based conventional neurons. Furthermore, the proposed L-BIMOS silicon neuron exhibits spiking frequency in the gigahertz range when the drain is biased at V-DG = 2.0 V.
引用
收藏
页码:2600 / 2606
页数:7
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