A Complete Design-for-Test Scheme for Reconfigurable Scan Networks

被引：0
|
作者：
Lylina, Natalia [1 ]
Wang, Chih-Hao [1 ]
Wunderlich, Hans-Joachim [1 ]
机构：
[1] Institute of Computer Architecture and Computer Engineering, University of Stuttgart, Stuttgart, Germany
来源：
Journal of Electronic Testing: Theory and Applications (JETTA) | 2022年 / 38卷 / 06期
关键词：
Design for testability;
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学科分类号：
摘要：
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页码：603 / 621
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