A Complete Design-for-Test Scheme for Reconfigurable Scan Networks

被引：0
|
作者：
Lylina, Natalia [1 ]
Wang, Chih-Hao [1 ]
Wunderlich, Hans-Joachim [1 ]
机构：
[1] Institute of Computer Architecture and Computer Engineering, University of Stuttgart, Stuttgart, Germany
来源：
Journal of Electronic Testing: Theory and Applications (JETTA) | 2022年 / 38卷 / 06期
关键词：
Design for testability;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
引用
收藏
页码：603 / 621
相关论文
共 50 条
  • [1] A Complete Design-for-Test Scheme for Reconfigurable Scan Networks
    Lylina, Natalia
    Wang, Chih-Hao
    Wunderlich, Hans-Joachim
    JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, 2023, 38 (6): : 603 - 621
  • [2] A Complete Design-for-Test Scheme for Reconfigurable Scan Networks
    Natalia Lylina
    Chih-Hao Wang
    Hans-Joachim Wunderlich
    Journal of Electronic Testing, 2022, 38 : 603 - 621
  • [3] Successful implementation of scan-based design-for-test
    Chandra, S
    EE-EVALUATION ENGINEERING, 1996, 35 (09): : 45 - &
  • [4] Secure scan: A design-for-test architecture for crypto chips
    Yang, Bo
    Wu, Kaijie
    Karri, Ramesh
    IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 2006, 25 (10) : 2287 - 2293
  • [5] Secure scan: A design-for-test architecture for crypto chips
    Yang, B
    Wu, KJ
    Karri, R
    42ND DESIGN AUTOMATION CONFERENCE, PROCEEDINGS 2005, 2005, : 135 - 140
  • [6] Design-for-test of asynchronous Networks-On-Chip
    Tran, Xuan-Tu
    Beroulle, Vincent
    Durupt, Jean
    Robach, Chantal
    Bertrand, Francois
    PROCEEDINGS OF THE 2006 IEEE WORKSHOP ON DESIGN AND DIAGNOSTICS OF ELECTRONIC CIRCUITS AND SYSTEMS, 2006, : 163 - +
  • [7] A Framework for Configurable Joint-Scan Design-for-Test Architecture
    Tudu, Jaynarayan T.
    Ahlawat, Satyadev
    Shukla, Sonali
    Singh, Virendra
    JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, 2021, 37 (5-6): : 593 - 611
  • [8] Test of Reconfigurable Modules in Scan Networks
    Cantoro, Riccardo
    Zadegan, Farrokh Ghani
    Palena, Marco
    Pasini, Paolo
    Larsson, Erik
    Reorda, Matteo Sonza
    IEEE TRANSACTIONS ON COMPUTERS, 2018, 67 (12) : 1806 - 1817
  • [9] Test Strategies for Reconfigurable Scan Networks
    Kochte, Michael A.
    Baranowski, Rafal
    Schaal, Marcel
    Wunderlich, Hans-Joachim
    2016 IEEE 25TH ASIAN TEST SYMPOSIUM (ATS), 2016, : 113 - 118
  • [10] A Framework for Configurable Joint-Scan Design-for-Test Architecture
    Jaynarayan T. Tudu
    Satyadev Ahlawat
    Sonali Shukla
    Virendra Singh
    Journal of Electronic Testing, 2021, 37 : 593 - 611
12345