Real-time X-ray diffraction measurement on laser shock-loaded hexanitrostilbene (HNS)

被引:0
|
作者
Xi, Tao [1 ]
Zhou, Wei-min [1 ]
Xin, Jian-ting [1 ]
Zhang, Huan [1 ]
Chu, Gen-bai [1 ]
Shui, Min [1 ]
Zhao, Yong-qiang [1 ]
Zhang, Hao-bin [2 ]
机构
[1] CAEP, Res Ctr Laser Fus, Natl Key Lab Plasma Phys, Mianyang 621900, Peoples R China
[2] CAEP, Inst Chem Mat, Mianyang 621999, Peoples R China
来源
ENERGETIC MATERIALS FRONTIERS | 2024年 / 5卷 / 03期
关键词
Dynamic X-ray diffraction; HNS; Laser shock; Detonation products;
D O I
10.1016/j.enmf.2024.04.002
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
Understanding the lattice evolution of hexanitrostilbene (HNS) is crucial for ensuring its safety and reliability under shock loading. However, the lack of in situ, real-time diagnostics has limited the availability of lattice parameters for shock-loaded explosives. In this study, we utilized dynamic X-ray diffraction technology to obtain the diffraction spectrum of laser shock-loaded HNS and to determine its temporal evolution. Additionally, by improving the laser energy, we initiated HNS and obtained the diffraction spectrum of detonation products during the detonation process. The experimental results showed the presence of a diamond structure in the detonation product, suggesting the existence of either diamond or diamond-like carbon. Our research not only elucidates the crystal structure of shock-loaded HNS and its detonation products but also provides an avenue for laboratory-scale investigations into dynamically loaded explosives, which furnishing an opportunity to unveil the underlying mechanism governing explosive dynamic response behavior.
引用
收藏
页码:224 / 231
页数:8
相关论文
共 50 条
  • [31] X-ray based real-time tracking
    Nguyen, D. T.
    RADIOTHERAPY AND ONCOLOGY, 2022, 170 : S617 - S618
  • [32] Real-time simulation for x-ray microanalysis
    Brundle, D
    Uritsky, Y
    Chernoff, D
    SOLID STATE TECHNOLOGY, 1996, 39 (03) : 105 - &
  • [33] Time resolved x-ray diffraction in shock compressed systems
    Radousky, H. B.
    Armstrong, M. R.
    Goldman, N.
    JOURNAL OF APPLIED PHYSICS, 2021, 129 (04)
  • [34] Real-time X-ray diffraction measurements of structural dynamics and polymorphism in diindenoperylene growth
    Kowarik, Stefan
    Gerlach, Alexander
    Sellner, Stefan
    Cavalcanti, Leide
    Konovalov, Oleg
    Schreiber, Frank
    APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 2009, 95 (01): : 233 - 239
  • [35] Real-time X-ray diffraction measurements of structural dynamics and polymorphism in diindenoperylene growth
    Stefan Kowarik
    Alexander Gerlach
    Stefan Sellner
    Leide Cavalcanti
    Oleg Konovalov
    Frank Schreiber
    Applied Physics A, 2009, 95 : 233 - 239
  • [36] Real-time direct and diffraction X-ray imaging of irregular silicon wafer breakage
    Rack, Alexander
    Scheel, Mario
    Danilewsky, Andreas N.
    IUCRJ, 2016, 3 : 108 - 114
  • [37] In Situ Real-Time X-Ray Diffraction During Thin Film Growth of Pentacene
    Watanabe, T.
    Hosokai, T.
    Koganezawa, T.
    Yoshimoto, N.
    MOLECULAR CRYSTALS AND LIQUID CRYSTALS, 2012, 566 : 18 - 21
  • [38] Microfocused X-ray transmission real-time observation of laser welding phenomena
    Katayama, Seiji
    Matsunawa, Akira
    Yosetsu Gakkai Shi/Journal of the Japan Welding Society, 2001, 70 (06): : 17 - 22
  • [39] Microfocused X-ray transmission real-time observation of laser welding phenomena
    Katayama, Seiji
    Matsunawa, Akira
    2001, Japan Welding Society (70):
  • [40] Characterization of voids in shock-loaded Al single crystal by combining X-ray tomography and electron microscopy
    Hong, Chuanshi
    Faester, Soren
    Hansen, Niels
    Huang, Xiaoxu
    Barabash, Rozaliya I.
    38TH RISO INTERNATIONAL SYMPOSIUM ON MATERIALS SCIENCE, 2017, 219