Near-Free Lifetime Extension for 3-D nand Flash via Opportunistic Self-Healing

被引：0

作者：

Ren, Tianyu ^{[1
]}

Li, Qiao ^{[2
]}

Lv, Yina ^{[1
]}

Ye, Min ^{[3
]}

Guan, Nan ^{[1
]}

Jason Xue, Chun ^{[4
]}

机构：

[1] City University of Hong Kong, Department of Computer Science, Hong Kong, Hong Kong

[2] Xiamen University, School of Informatics, Xiamen,361005, China

[3] YEESTOR Microelectronics Company Ltd., Memory Department, Shenzhen,518057, China

[4] Mohamed bin Zayed University of Artificial Intelligence, Department of Computer Science, Abu Dhabi, United Arab Emirates

来源：

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems | 2024年 / 43卷 / 11期

基金：

中国国家自然科学基金;

关键词：

D O I：

暂无

中图分类号：

学科分类号：

摘要：

Memory architecture - NAND circuits

引用

页码：4226 / 4237

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