Near-Free Lifetime Extension for 3-D nand Flash via Opportunistic Self-Healing

被引：0
|
作者：
Ren, Tianyu [1 ]
Li, Qiao [2 ]
Lv, Yina [1 ]
Ye, Min [3 ]
Guan, Nan [1 ]
Jason Xue, Chun [4 ]
机构：
[1] City University of Hong Kong, Department of Computer Science, Hong Kong, Hong Kong
[2] Xiamen University, School of Informatics, Xiamen,361005, China
[3] YEESTOR Microelectronics Company Ltd., Memory Department, Shenzhen,518057, China
[4] Mohamed bin Zayed University of Artificial Intelligence, Department of Computer Science, Abu Dhabi, United Arab Emirates
来源：
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems | 2024年 / 43卷 / 11期
基金：
中国国家自然科学基金;
关键词：
Compilation and indexing terms; Copyright 2025 Elsevier Inc;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
Memory architecture - NAND circuits
引用
收藏
页码：4226 / 4237
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